302 lines
7.9 KiB
C
302 lines
7.9 KiB
C
/**********************************************************************
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*
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* Filename: memtest.c
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*
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* Description: General-purpose memory testing functions.
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*
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* Notes: This software can be easily ported to systems with
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* different data bus widths by redefining 'datum'.
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*
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*
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* Copyright (c) 1998 by Michael Barr. This software is placed into
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* the public domain and may be used for any purpose. However, this
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* notice must not be changed or removed and no warranty is either
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* expressed or implied by its publication or distribution.
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**********************************************************************/
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#include "os_types.h"
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#include "os_utils.h"
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#include "dbg_io.h"
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#include "iot_io.h"
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#include "iot_clock.h"
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#include "memtest.h"
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#include "system.h"
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#include "ahb.h"
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#include "ddrc.h"
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/**********************************************************************
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*
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* Function: memTestDataBus()
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*
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* Description: Test the data bus wiring in a memory region by
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* performing a walking 1's test at a fixed address
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* within that region. The address (and hence the
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* memory region) is selected by the caller.
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*
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* Notes:
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*
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* Returns: 0 if the test succeeds.
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* A non-zero result is the first pattern that failed.
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*
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**********************************************************************/
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datum
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memTestDataBus(volatile datum * address)
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{
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datum pattern;
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/*
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* Perform a walking 1's test at the given address.
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*/
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for (pattern = 1; pattern != 0; pattern <<= 1)
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{
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/*
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* Write the test pattern.
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*/
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*address = pattern;
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/*
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* Read it back (immediately is okay for this test).
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*/
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if (*address != pattern)
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{
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return (pattern);
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}
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}
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return (0);
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} /* memTestDataBus() */
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/**********************************************************************
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*
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* Function: memTestAddressBus()
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*
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* Description: Test the address bus wiring in a memory region by
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* performing a walking 1's test on the relevant bits
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* of the address and checking for aliasing. This test
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* will find single-bit address failures such as stuck
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* -high, stuck-low, and shorted pins. The base address
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* and size of the region are selected by the caller.
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*
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* Notes: For best results, the selected base address should
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* have enough LSB 0's to guarantee single address bit
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* changes. For example, to test a 64-Kbyte region,
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* select a base address on a 64-Kbyte boundary. Also,
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* select the region size as a power-of-two--if at all
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* possible.
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*
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* Returns: NULL if the test succeeds.
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* A non-zero result is the first address at which an
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* aliasing problem was uncovered. By examining the
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* contents of memory, it may be possible to gather
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* additional information about the problem.
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*
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**********************************************************************/
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datum *
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memTestAddressBus(volatile datum * baseAddress, unsigned long nBytes)
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{
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unsigned long addressMask = (nBytes/sizeof(datum) - 1);
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unsigned long offset;
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unsigned long testOffset;
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datum pattern = (datum) 0xAAAAAAAA;
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datum antipattern = (datum) 0x55555555;
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/*
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* Write the default pattern at each of the power-of-two offsets.
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*/
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for (offset = 1; (offset & addressMask) != 0; offset <<= 1)
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{
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baseAddress[offset] = pattern;
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}
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/*
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* Check for address bits stuck high.
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*/
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testOffset = 0;
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baseAddress[testOffset] = antipattern;
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for (offset = 1; (offset & addressMask) != 0; offset <<= 1)
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{
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if (baseAddress[offset] != pattern)
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{
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return ((datum *) &baseAddress[offset]);
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}
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}
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baseAddress[testOffset] = pattern;
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/*
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* Check for address bits stuck low or shorted.
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*/
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for (testOffset = 1; (testOffset & addressMask) != 0; testOffset <<= 1)
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{
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baseAddress[testOffset] = antipattern;
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if (baseAddress[0] != pattern)
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{
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return ((datum *) &baseAddress[testOffset]);
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}
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for (offset = 1; (offset & addressMask) != 0; offset <<= 1)
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{
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if ((baseAddress[offset] != pattern) && (offset != testOffset))
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{
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return ((datum *) &baseAddress[testOffset]);
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}
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}
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baseAddress[testOffset] = pattern;
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}
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return (NULL);
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} /* memTestAddressBus() */
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/**********************************************************************
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*
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* Function: memTestDevice()
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*
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* Description: Test the integrity of a physical memory device by
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* performing an increment/decrement test over the
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* entire region. In the process every storage bit
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* in the device is tested as a zero and a one. The
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* base address and the size of the region are
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* selected by the caller.
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*
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* Notes:
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*
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* Returns: NULL if the test succeeds.
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*
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* A non-zero result is the first address at which an
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* incorrect value was read back. By examining the
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* contents of memory, it may be possible to gather
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* additional information about the problem.
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*
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**********************************************************************/
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datum *
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memTestDevice(volatile datum * baseAddress, unsigned long nBytes)
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{
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unsigned long offset;
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unsigned long nWords = nBytes / sizeof(datum);
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datum pattern;
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datum antipattern;
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/*
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* Fill memory with a known pattern.
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*/
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for (pattern = 1, offset = 0; offset < nWords; pattern++, offset++)
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{
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baseAddress[offset] = pattern;
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}
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/*
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* Check each location and invert it for the second pass.
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*/
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for (pattern = 1, offset = 0; offset < nWords; pattern++, offset++)
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{
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if (baseAddress[offset] != pattern)
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{
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return ((datum *) &baseAddress[offset]);
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}
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antipattern = ~pattern;
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baseAddress[offset] = antipattern;
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}
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/*
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* Check each location for the inverted pattern and zero it.
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*/
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for (pattern = 1, offset = 0; offset < nWords; pattern++, offset++)
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{
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antipattern = ~pattern;
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if (baseAddress[offset] != antipattern)
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{
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return ((datum *) &baseAddress[offset]);
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}
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}
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return (NULL);
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} /* memTestDevice() */
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int
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memTest(void)
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{
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#define BASE_ADDRESS (volatile datum *) 0x18000000
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#define NUM_BYTES (8 * 1024 * 1024)
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volatile datum* addr = NULL;
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if (memTestDataBus(BASE_ADDRESS) != 0)
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{
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iot_printf("data bus failed....\n");
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return (-1);
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}
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addr = memTestAddressBus(BASE_ADDRESS, NUM_BYTES);
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if( addr != NULL)
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{
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iot_printf("address failed:0x%x\n", addr);
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return (-1);
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}
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addr = memTestDevice(BASE_ADDRESS, NUM_BYTES);
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if( addr != NULL)
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{
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iot_printf("device failed:0x%x\n", addr);
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return (-1);
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}
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return (0);
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} /* memTest() */
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int main(void)
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{
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int test_result = 0;
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dbg_uart_init();
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// disable cache
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ahb_cache_disable();
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//ddr init;
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ddr_cache_init();
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// enable ahb cache
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ahb_cache_enable();
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//ahb_cache_reset();
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//enable dmc cache;
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ahb_dmc_cache_enable();
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//cache space init;
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ahb_cache_fill_valid_space();
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test_result = memTest();
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if (0 == test_result) {
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iot_printf("memory test passed....\n");
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} else {
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iot_printf("memory test failed....\n");
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}
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iot_printf("MEMTEST VERSION(HEX): 11.0.1.1\n");
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iot_printf("build date: "__DATE__". time: "__TIME__".\r\n");
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if (0 == test_result) {
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iot_printf("restart by software after test passed.\n");
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iot_delay_us_cpu_cycle(100000);
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system_restart_chip_by_soft();
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}
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while(1);
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return 0;
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}
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